MAUD is a free software to analyse diffraction data using a combined Rietveld method. Its capabilities extend beyond diffraction and include fluorescence and reflectivity. It can analyse data from X-ray sources as well as neutrons, TOF, electrons from TEM.

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  • MAUD is a free software running in a Java Virtual Machine (included). As a standalone software it can be used as it is.
  • You are permitted to use it for the purposes it was build (scientific analyses of materials and compounds) without restrictions and the author is not responsible for different or improper use of it. As the source code is available in the github page, you are encouraged to extend it and contribute to its development. You are not permitted to re-distribute or sell the MAUD software. You can share these web pages through links or other means.


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